Testing for EMC compliance : approaches and techniques / Mark I. Montrose, Edward M. Nakauchi.

By:

Montrose, Mark I

Contributor(s):

Nakauchi, Edward M

Material type: Text

TextPublication details: Hoboken, NJ : John Wiley, 2004.Description: xviii, 460 p. : ill. ; 24 cmISBN:

047143308X (cloth)
9780471433088

Subject(s):

DDC classification:

621.382 22 MON

LOC classification:

TK7867.2 M66 2004

Online resources:

Contents:

Electric, Magnetic, and Static Fields -- Instrumentation -- Test Facilities -- Probes, Antennas, and Support Equipment -- Conducted Testing --

Summary: The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages.

List(s) this item appears in: New Arrivals January March 2022

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Reference	IIITDM Kurnool Reference	Reference	621.382 MON (Browse shelf(Opens below))	Not For Loan		0004348

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Previous	621.3815 MAY Fundamentals of semiconductor manufacturing and process control /	621.382 Introduction to Analog and Digital Communications	621.382 HAN Fundamentals of nanoelectronics	621.382 MON Testing for EMC compliance :	621.382 ROH Microwave and Wireless Synthesizers: Theory and Design,	621.382 SEV A practical guide to EMC engineering /	621.3822 GAN Embedded signal processing with the Micro Signal Architecture /	Next

Electric, Magnetic, and Static Fields -- Instrumentation -- Test Facilities -- Probes, Antennas, and Support Equipment -- Conducted Testing --

The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages.

Includes bibliographical references (p. 447-451) and index.

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