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Pattern classification and scene analysis [by] Richard O. Duda [and] Peter E. Hart.

By:

Duda, Richard O

Contributor(s):

Material type: Text

TextPublication details: NewDelhi, Wiley [c2006]Edition: 2nd EDDescription: xvii, 654 p. illus. 23 cmISBN:

9788126511167

Subject(s):

DDC classification:

004.1 DUD

LOC classification:

Q327 .D83

Online resources:

Contents:

Introduction -- Bayesian decision theory -- Maximum-likelihood and Bayesian parameter estimation -- Nonparametric techniques -- Linear discriminant functions -- Multilayer neural networks -- Stochastic methods -- Nonmetric methods -- Algorithm-independent machine learning -- Unsupervised learning and clustering -- Mathematical foundations.

Summary: It is a systematic account of the major topics in pattern recognition, based on the fundamental principles. It includes extensive examples.

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Holdings
Item type	Current library	Call number	Status	Barcode
Books	IIITDM Kurnool General Stacks	004.1 DUD (Browse shelf(Opens below))	Available	0001300
Books	IIITDM Kurnool General Stacks	004.1 DUD (Browse shelf(Opens below))	Available	0001301
Books	IIITDM Kurnool General Stacks	004.1 DUD (Browse shelf(Opens below))	Available	0001302

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"A Wiley-interscience publication."

Introduction --

Bayesian decision theory --

Maximum-likelihood and Bayesian parameter estimation --
Nonparametric techniques --
Linear discriminant functions --
Multilayer neural networks --
Stochastic methods --
Nonmetric methods --
Algorithm-independent machine learning --
Unsupervised learning and clustering --
Mathematical foundations.

It is a systematic account of the major topics in pattern recognition, based on the fundamental principles. It includes extensive examples.

Includes bibliographies.

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