Montrose, Mark I. <br/><br/>
Testing for EMC compliance :  approaches and techniques / 
Mark I. Montrose, Edward M. Nakauchi. 
 - Hoboken, NJ :  John Wiley,  2004. 
 - xviii, 460 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references (p. 447-451) and index. 
<br/><br/> Electric, Magnetic, and Static Fields --  Instrumentation --  Test Facilities --  Probes, Antennas, and Support Equipment --  Conducted Testing -- 
<br/><br/> The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages. 
<br/><br/><label>ISBN: </label>047143308X (cloth) 9780471433088 
<br/><br/><label>LCCN: </label>2003063488 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electromagnetic compatibility.<br/>Electromagnetic interference.
<br/><br/><label>LC Class. No.: </label>TK7867.2  / M66 2004 
<br/><br/><label>Dewey Class. No.: </label>621.382  / MON