TY  - BOOK
AU  - Montrose,Mark I.
AU  - Nakauchi,Edward M.
TI  - Testing for EMC compliance: approaches and techniques 
SN  - 047143308X (cloth)
AV  - TK7867.2 M66 2004
U1  - 621.382 22
PY  - 2004///
CY  - Hoboken, NJ
PB  - John Wiley
KW  - Electromagnetic compatibility
KW  - Electromagnetic interference
N1  - Includes bibliographical references (p. 447-451) and index; Electric, Magnetic, and Static Fields --; Instrumentation --; Test Facilities --; Probes, Antennas, and Support Equipment --; Conducted Testing --
N2  - The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages
UR  - http://www.loc.gov/catdir/bios/wiley046/2003063488.html
UR  - http://www.loc.gov/catdir/description/wiley041/2003063488.html
UR  - http://www.loc.gov/catdir/toc/wiley041/2003063488.html
ER  -