Duda, Richard O. <br/><br/>
Pattern classification and scene analysis 
[by] Richard O. Duda [and] Peter E. Hart. 
 - 2nd ED. 
 - NewDelhi,  Wiley  [c2006] 
 - xvii, 654 p.  illus.  23 cm. 
<br/><br/> "A Wiley-interscience publication." 
<br/><br/>Includes bibliographies. 
<br/><br/> 	Introduction --<br/><br/>  Bayesian decision theory --<br/>  <br/>Maximum-likelihood and Bayesian parameter estimation --<br/>  Nonparametric techniques --<br/>  Linear discriminant functions --<br/>  Multilayer neural networks --<br/>  Stochastic methods --<br/>  Nonmetric methods --<br/>  Algorithm-independent machine learning --<br/>  Unsupervised learning and clustering --<br/>  Mathematical foundations. 
<br/><br/>  It is a systematic account of the major topics in pattern recognition, based on the fundamental principles. It includes extensive examples. 
<br/><br/><label>ISBN: </label>9788126511167 
<br/><br/><label>LCCN: </label>72007008  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Pattern recognition systems.<br/>Statistical decision.<br/>Pattern Recognition, Automated.
<br/><br/><label>LC Class. No.: </label>Q327  / .D83 
<br/><br/><label>Dewey Class. No.: </label>004.1  / DUD