TY  - BOOK
AU  - Kang,Sung-Mo
AU  - 
AU  - Leblebici,Yusuf
TI  - CMOS digital integrated circuits: analysis and design 
SN  - 9789353165093
AV  - TK7871.99.M44 K36 2015
U1  - 621.304 23
PY  - 2015///]
CY  - New York, NY
PB  - McGraw-Hill Education
KW  - Metal oxide semiconductors, Complementary
KW  - Digital integrated circuits
N1  - Includes bibliographical references and index; ch. 1 Introduction -; ch. 2 Fabrication of MOSFETs; ch. 3 MOS Transistor; ch. 4 Modelling of MOS Transistors Using SPICE; ch. 5 MOS Inverters: Static Characteristics -; ch. 6 MOS Inverters: Switching Characteristics and Interconnect Effects --; ch. 7 Combinational MOS Logic Circuits; ch. 8 Sequential MOS Logic Circuits; . 9 Dynamic Logic Circuits; ch. 10 Semiconductor Memories; ch. 11 Low-Power CMOS Logic Circuits; ch. 12 Arithmetic Building Blocks; ch. 13 Clock and I/O Circuits; ch. 14 Design for Manufacturability; ch. 15 Design for Testability --
N2  - 	
"The fourth edition of CMOS Digital Integrated Circuits: Analysis and Design continues the well-established tradition of the earlier editions by offering the most comprehensive coverage of digital CMOS circuit design, as well as addressing state-of-the-art technology issues highlighted by the widespread use of nanometer-scale CMOS technologies. In this latest edition, virtually all chapters have been re-written, the transistor model equations and device parameters have been revised to reflect the significant changes that must be taken into account for new technology generations, and the material has been reinforced with up-to-date examples. The broad-ranging coverage of this textbook starts with the fundamentals of CMOS process technology, and continues with MOS transistor models, basic CMOS gates, interconnect effects, dynamic circuits, memory circuits, arithmetic building blocks, clock and I/O circuits, low power design techniques, design for manufacturability and design for testability"
ER  -