Testing for EMC compliance : approaches and techniques / Mark I. Montrose, Edward M. Nakauchi.

By:

Montrose, Mark I

Contributor(s):

Nakauchi, Edward M

Material type: Text

TextPublication details: Hoboken, NJ : John Wiley, 2004.Description: xviii, 460 p. : ill. ; 24 cmISBN:

047143308X (cloth)
9780471433088

Subject(s):

DDC classification:

621.382 22 MON

LOC classification:

TK7867.2 M66 2004

Online resources:

Contents:

Electric, Magnetic, and Static Fields -- Instrumentation -- Test Facilities -- Probes, Antennas, and Support Equipment -- Conducted Testing --

Summary: The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages.

List(s) this item appears in: New Arrivals January March 2022

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
Reference	IIITDM Kurnool Reference	Reference	621.382 MON (Browse shelf(Opens below))	Not For Loan		0004348

Electric, Magnetic, and Static Fields -- Instrumentation -- Test Facilities -- Probes, Antennas, and Support Equipment -- Conducted Testing --

The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages.

Includes bibliographical references (p. 447-451) and index.

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