000 01883cam a22003494a 4500
999 _c1436
_d1436
001 13373150
005 20220322114706.0
008 031015s2004 njua b 001 0 eng
010 _a 2003063488
020 _a047143308X (cloth)
020 _a9780471433088
040 _aDLC
_cDLC
_dDLC
_dDLC
042 _apcc
050 0 0 _aTK7867.2
_bM66 2004
082 0 0 _a621.382
_222
_bMON
100 1 _aMontrose, Mark I.
245 1 0 _aTesting for EMC compliance :
_bapproaches and techniques /
_cMark I. Montrose, Edward M. Nakauchi.
260 _aHoboken, NJ :
_bJohn Wiley,
_c2004.
300 _axviii, 460 p. :
_bill. ;
_c24 cm.
505 _tElectric, Magnetic, and Static Fields --
_tInstrumentation --
_tTest Facilities --
_tProbes, Antennas, and Support Equipment --
_tConducted Testing --
520 _aThe Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages.
650 0 _aElectromagnetic compatibility.
650 0 _aElectromagnetic interference.
700 1 _aNakauchi, Edward M.
942 _2ddc
_cBK
504 _aIncludes bibliographical references (p. 447-451) and index.
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/bios/wiley046/2003063488.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/wiley041/2003063488.html
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/wiley041/2003063488.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg