000 | 01883cam a22003494a 4500 | ||
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999 |
_c1436 _d1436 |
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001 | 13373150 | ||
005 | 20220322114706.0 | ||
008 | 031015s2004 njua b 001 0 eng | ||
010 | _a 2003063488 | ||
020 | _a047143308X (cloth) | ||
020 | _a9780471433088 | ||
040 |
_aDLC _cDLC _dDLC _dDLC |
||
042 | _apcc | ||
050 | 0 | 0 |
_aTK7867.2 _bM66 2004 |
082 | 0 | 0 |
_a621.382 _222 _bMON |
100 | 1 | _aMontrose, Mark I. | |
245 | 1 | 0 |
_aTesting for EMC compliance : _bapproaches and techniques / _cMark I. Montrose, Edward M. Nakauchi. |
260 |
_aHoboken, NJ : _bJohn Wiley, _c2004. |
||
300 |
_axviii, 460 p. : _bill. ; _c24 cm. |
||
505 |
_tElectric, Magnetic, and Static Fields -- _tInstrumentation -- _tTest Facilities -- _tProbes, Antennas, and Support Equipment -- _tConducted Testing -- |
||
520 | _aThe Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages. | ||
650 | 0 | _aElectromagnetic compatibility. | |
650 | 0 | _aElectromagnetic interference. | |
700 | 1 | _aNakauchi, Edward M. | |
942 |
_2ddc _cBK |
||
504 | _aIncludes bibliographical references (p. 447-451) and index. | ||
856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley046/2003063488.html |
856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley041/2003063488.html |
856 | 4 | 1 |
_3Table of contents _uhttp://www.loc.gov/catdir/toc/wiley041/2003063488.html |
906 |
_a7 _bcbc _corignew _d1 _eocip _f20 _gy-gencatlg |